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DRA821U4...ALM 数据表(PDF) 107 Page - Texas Instruments

部件名 DRA821U4...ALM
功能描述  DRA821 Jacinto™ Processors
PDF  252 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

DRA821U4...ALM 数据表(HTML) 107 Page - Texas Instruments

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7.8 Thermal Resistance Characteristics
This section provides the thermal resistance characteristics used on this device.
For reliability and operability concerns, the maximum junction temperature of the device has to be at or below
the TJ value identified in Section 7.3, Recommended Operating Conditions.
7.8.1 Thermal Resistance Characteristics
It is recommended to perform thermal simulations at the system level with the worst case device power consumption.
NO.
PARAMETER
DESCRIPTION
ALM PACKAGE
°C/W
(1)(3)
AIR FLOW
(m/s)
(2)
T1
RΘJC
Junction-to-case
0.54
N/A
T2
RΘJB
Junction-to-board
2.9
N/A
T3
RΘJA
Junction-to-free air
12.8
0
T4
Junction-to-moving air
9.1
1
T5
8.1
2
T6
7.5
3
T7
ΨJT
Junction-to-package top
0.5
0
T8
0.3
1
T9
0.3
2
T10
0.3
3
T11
ΨJB
Junction-to-board
2.8
0
T12
2.8
1
T13
2.7
2
T14
2.7
3
(1)
These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-9, Test Boards for Area Array Surface Mount Packages
(2)
m/s = meters per second.
(3)
°C/W = degrees Celsius per watt.
www.ti.com
DRA821U-Q1
SPRSP57D – APRIL 2020 – REVISED DECEMBER 2022
Copyright © 2022 Texas Instruments Incorporated
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