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H5GQ2H24AFR-R0C 数据表(PDF) 170 Page - Hynix Semiconductor |
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H5GQ2H24AFR-R0C 数据表(HTML) 170 Page - Hynix Semiconductor |
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170 / 172 page ![]() This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsability for use of circuits described. No patent licenses are implied. Rev. 1.2 /Nov. 2011 170 H5GQ2H24AFR Notes: 1. The parameter applies only when SEN is asserted. Figure 88. Scan Capture Timing Scan clock to valid scan output tSAC ‐ 6ns 1 Scan clock to scan output hold tSOH 1.5 ‐ ns 1 Table 60. Scan AC Electrical Characteristics PARAMETER/CONDITION SYMBOL MIN MAX UNIT S NOTES SCK SEN tSDS tSDH Pins under Test VALID tSES SSH SOE# tSCS (Low) Not a true clock, but a single pulse or a series of pulses |
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