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PC87373 数据表(PDF) 157 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 PC87373
功能描述  LPC SuperI/O with Glue Functions
PDF  174 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

PC87373 数据表(HTML) 157 Page - National Semiconductor (TI)

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13.0 Device Characteristics (Continued)
157
www.national.com
Revision 1.1
13.3 INTERNAL RESISTORS
DC Test Conditions
Figure 44. Internal Resistor Test Conditions, TA =0°Cto70°C, VSUP = 3.3V
Figure 45. Internal Pull-Down Resistor for Straps, TA =0°Cto70°C, VSUP = 3.3V
Notes for Figures 44 and 45:
1. VSUP is VDD3 or VSB3 according to the pin power well.
1. The equivalent resistance of the pull-up resistor is calculated by RPU = (VSUP − VPIN) / IPU.
2. The equivalent resistance of the pull-down resistor is calculated by RPD = VPIN / IPD.
13.3.1 Pull-Up Resistor
Symbol: PUnn
13.3.2 Pull-Down Resistor
Symbol: PDnn
Symbol
Parameter
Conditions1
1. TA = 0
°C to 70°C, V
SUP = 3.3V.
Min2
2. Not tested. Guaranteed by characterization.
Typical
Max2
Unit
RPU
Pull-up equivalent resistance
VPIN =0V
nn
− 30%
nn
nn + 30%
K
VPIN = 0.8 VSUP
3
nn
− 38%
K
VPIN = 0.17 VSUP
3
3. For strap pins only.
nn
− 35%
K
Symbol
Parameter
Conditions1
1. TA = 0
°C to 70°C, V
SUP = 3.3V.
Min2
2. Not tested. Guaranteed by characterization.
Typical
Max2
Unit
RPD
Pull-down equivalent resistance
VPIN =VSUP
nn
− 30%
nn
nn + 30%
K
Device
Under
Test
RPU
Pull-Up Resistor Test Circuit
Pull-Down Resistor Test Circuit
VSUP
Pin
A
IPU
V
VPIN
Device
Under
Test
RPD
VSUP
Pin
A
IPD
V
VPIN
VSUP
Device
Under
Test
RPU
VSUP
Pin
A
IPU
V
VPIN
VSUP
Device
Under
Test
RPU
VSUP
Pin
A
IPU
V
VPIN
10
µA
VPIN < VIL
VPIN > VIH
10
µA
10 K



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